| 2023 |
MMP Net: A feedforward neural network model with sequential inputs for representing continuous multistage manufacturing processes without intermediate outputs (IISE Trans.), Prof. Chiehyeon Lim |
01.01 - 12.31 |
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| 2023 |
Hong Kong World: Leveraging Structural Regularity for Line-based SLAM (IEEE Trans. Pattern Anal. Mach. Intell.), Prof. Kyungdon Joo |
01.01 - 12.31 |
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| 2023 |
From technology enablers to circular economy: Data-driven understanding of the overview of servitization and product-service systems in Industry 4.0 (Comput. Ind.), Prof. Chiehyeon Lim |
01.01 - 12.31 |
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| 2023 |
Bayesian-based uncertainty-aware tool-wear prediction model in end-milling process of titanium alloy (Appl. Soft. Comput.), Prof. Sunghoon Lim |
01.01 - 12.31 |
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| 2023 |
Stop-loss adjusted labels for machine learning-based trading of risky assets (Financ. Res. Lett.), Prof. Dong-Young Lim |
01.01 - 12.31 |
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| 2023 |
TS-Net: A Deep Learning Framework for Automated Assessment of Longitudinal Tumor Volume Changes in an Orthotopic Breast Cancer Model Using MRI (IEEE Access), Prof. Jimin Lee |
01.01 - 12.31 |
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| 2023 |
Deep learning-based label-free hematology analysis framework using optical diffraction tomography (Heliyon), Prof. Jimin Lee |
01.01 - 12.31 |
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| 2023 |
Training-Free Stuck-At Fault Mitigation for ReRAM-Based Deep Learning Accelerators (IEEE Trans. Comput-Aided Des. Integr. Circuits Syst.), Prof. Jongeun Lee |
01.01 - 12.31 |
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| 2023 |
Offline Training-Based Mitigation of IR Drop for ReRAM-Based Deep Neural Network Accelerators (IEEE Trans. Comput-Aided Des. Integr. Circuits Syst.), Prof. Jongeun Lee |
01.01 - 12.31 |
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| 2023 |
A product acceptance decision-making method based on process capability with considering gauge measurement errors (Commun. Stat.-Theory Methods), Prof. Junghye Lee |
01.01 - 12.31 |
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